Scrapheap challenge: Fault tolerant designs allow defective chips to be used instead of scrapped

18-06-2011

The UK magazine New Electronics talked for their article ‘Scrapheap challenge’ to three experts in the field, amongst whom our CTO Gerard Rauwerda,  to find out how they are addressing the issues for 'fault tolerant designs'. To quote the magazine: 'Circuit designers are rapidly coming to terms with the idea that it is impossible to build error free chips. The solution is fault tolerant architectures, combined with mechanisms for detecting and repairing errors, or at least mitigating their impact. [...] Spare resources are inherent to multicore designs and these are being exploited successfully, together with the application of evolving error detection, recovery and repair schemes, to make faulty devices usable, improve reliability and provide predictable operation.'


In the article, the CRISP General Stream Processor developed by the Recore-led CRISP consortium is highlighted as an example of a fault-tolerant architecture.

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