In the media
Scrapheap challenge: Fault tolerant designs allow defective chips to be used instead of scrapped
18-06-11
The UK magazine New Electronics talked for their article ‘Scrapheap challenge’ to three experts in the field, amongst whom our CTO Gerard...Read article
Interview with Paul Heysters
17-06-11
The Dutch magazine Bits & Chips interviewed our CEO Paul Heysters for their special on Multi-cores. In this all-embracing interview,...Read article
Innovation in the spotlight: higher performance of manycore chips
29-10-10
The Dutch Technology Magazine for ICT professionals Automatisering Gids highlights Recore as the project leader of CRISP (Cutting edge...Read article
